Atomic Layer Deposition (ALD) is the key technology for the semiconductor industry to keep Moore’s Law on track. ALD processes can be used for the deposition of barrier materials, nucleation layers, metallization, and high and low k dielectrics. Sigma-Aldrich is committed to advance your research with our line of ALD precursors. We also offer key precursors prepacked for use in Cambridge NanoTech Inc ALD Systems. If you can't find a suitable precursor, please see our CVD Precusrors page for additional ideas.
| Addtional ALD
Precursors |
Materials Deposited |
Element |
Product Name |
Metals Purity (%) |
Formula
Weight
(g/mol) |
Melting Point
(ºC) |
Sublimation/ Boiling Temp.
(ºC) |
Product
Number |
|
Al2O3 AlN AlP AlAs LaAlO3 Aluminates |
Al |
Aluminum sec-butoxide |
99.99 |
246.33 |
- |
200-206/
30 mm Hg |
511609 |
|
Al |
Diethylaluminum ethoxide |
97 |
130.17 |
2.5-4.5 |
108-109/
10 mm Hg |
256749 |
|
Al |
Trimethylaluminum |
97 |
114.17 |
15 |
128-130/50mm Hg |
257222 |
|
Al |
Tris(diethylamido)aluminum |
99.99 |
486.74 |
28-31 |
50/
20 mm Hg |
J100030 |
|
Al |
Tris(ethylmethylamido)aluminum |
99.99 |
402.58 |
- |
- |
J100029 |
|
MgB2 BN, B4C B2O3 B doping |
B |
Diborane (10% in Hydrogen) |
- |
27.67 |
- |
92.5 |
463051 |
|
B |
Trimethylboron |
98.35 |
55.92 |
161.5 |
20.2 |
463094 |
|
Ga2O3 GaN GaP GaAs |
Ga |
Trimethylgallium |
99.999 |
114.83 |
-15.8 |
92.5 |
J100015 |
|
Ga |
Tris(dimethylamido)aluminum |
98 |
201.95 |
104-105.5 |
55.7 |
546534 |
|
GeO2 GeSi |
Ge |
Digermane (10% in H2) |
99.99 |
151.23 |
109 |
31.5 |
463078 |
|
Ge |
Germane |
99.997 |
76.62 |
165 |
88.4 |
463027 |
|
Ge |
Tetramethylgermanium |
98 |
132.73 |
-88 |
43-44/740 mm Hg |
396354 |
|
HfO2 Hf3N4 |
Hf |
Hafnium(IV) chloride |
99.9 |
320.3 |
- |
- |
590592 |
|
Hf |
Hafnium(IV) tert-butoxide |
99.99 |
473.95
|
- |
90/5 mm Hg
|
445541 |
|
Hf |
Tetrakis(diethylamido)hafnium(IV)
|
99.99 |
467.01
|
- |
130/0.01 mm Hg |
455202 |
|
Hf |
Tetrakis(dimethylamido)hafnium(IV)
|
99.99 |
354.8
|
26-29 |
-
|
455199 |
|
Hf |
Tetrakis(ethylmethylamido)hafnium(IV) |
99.99 |
410.9 |
- |
78/0.01 mm Hg |
553123 |
|
Mg dopant in IIIV Matls |
Mg |
Bis(cyclopentadienyl)magnesium(II)
|
99.99 |
154.49
|
180
|
- |
J100042 |
|
Mg |
Bis(pentamethylcyclopentadienyl)magnesium(II) |
99.99 |
294.77 |
230 (dec.) |
- |
512540 |
|
Mn Source |
Mn |
Bis(ethylcyclopentadienyl)manganese |
- |
241.24 |
- |
80 |
510637 |
|
MoS2 MoO2 |
Mo |
Molybdenum hexacarbonyl
|
99.9
|
264
|
150 |
156 |
577766 |
|
Nb2O5 |
Nb |
Niobium(V) ethoxide |
99.999 |
318.21 |
5-6 |
142/
0.1 mm Hg |
J100036 |
|
Ni,NiO |
Ni |
Bis(methylcyclopentadienyl)
nickel(II) |
97 |
216.96 |
34-36 |
85-90/
1 mm Hg |
510475 |
|
Ni |
Bis(ethylcyclopentadienyl)magnesium(II) |
- |
245.01 |
- |
90 |
510483 |
|
PtO2 |
Pt |
Cyclopentadienyl(trimethyl)
platinum(IV) |
99 |
319.31 |
30-31 |
- |
645605 |
|
Ru, RuO2 |
Ru |
Bis(ethylcyclopentadienyl)
ruthenium(II) |
99 |
235.29 |
6 |
100/
0.01 mm Hg |
648663 |
|
Sb Source |
Sb |
Tris(dimethylamido)antimony |
99.99 |
253.98 |
- |
32-34/
0.45 mm Hg |
553972 |
SiO2 Si3N4
SiC
SiON |
Si |
2,4,6,8-Tetramethylcyclotetrasiloxane |
99.999 |
240.51 |
69 |
134 |
512990 |
|
Si |
Dimethoxydimethylsilane |
99.999 |
120.23 |
- |
81.4 |
556688 |
|
Si |
Disilane |
99.998 |
62.22 |
132.6 |
14.5 |
463043 |
|
Si |
Methylsilane |
99.9 |
46.15 |
157 |
57 |
462993 |
|
Si |
Octamethylcyclotetrasiloxane |
98 |
296.62 |
17-18 |
175-176 |
235695 |
|
Si |
Silane |
99.998 |
32.12 |
185 |
112 |
333891 |
|
Si |
Tris(isopropoxy)silanol |
99 |
222.36 |
- |
- |
J100028 |
|
Si |
Tris(tert-butyoxy)silanol |
99.999 |
264.43 |
63-65 |
205-210 |
553468 |
|
Si |
Tris(tert-pentoxy)silanol |
99.99 |
306.51 |
- |
96-99/
2.5 mm Hg |
553441 |
|
Ta2O5 TaN |
Ta |
Pentakis(dimethylamido)tantalum(V) |
99.99 |
401.33 |
100 (dec.) |
- |
496863
|
|
Ta |
Tris(diethylamido)(tert-butylimido)
tantalum(V) |
99.99 |
468.46 |
- |
- |
521280 |
TiN
TiO2 |
Ti |
Bis(diethylamino)bis(diisopropylamino)
titanium(IV) |
99.99 |
280.31 |
- |
80/
0.1 mm Hg |
J100026 |
|
Ti |
Tetrakis(diethylamido)titanium(IV) |
99.99 |
336.42 |
- |
112/
0.1 mm Hg |
469866 |
|
Ti |
Tetrakis(dimethylamido)titanium(IV) |
99.999 |
224.21 |
- |
50/
0.5 mm Hg |
469858 |
|
Ti |
Tetrakis(ethylmethylamido)
titanium(IV) |
99.99 |
280.32 |
- |
80/
0.1 mm Hg |
473537 |
W
WO2 WO3
WC |
W |
Bis(tert-butylimido)bis(dimethylamido)
tungsten(VI) |
99.99 |
468.46 |
- |
81/ 0.02 mm Hg |
577936 |
|
W |
Tungsten hexacarbonyl |
99.9 |
351.91 |
150 |
- |
472956 |
|
Y2O3 YBaCuOx |
Y |
Tris(N,N-bis(trimethylsilyl)amide)
yttrium(III) |
98 |
570.07 |
161- 166 |
- |
524514 |
|
ZnO2 |
Zn |
Diethylzinc |
- |
123.49 |
-28 |
117 |
256781 |
|
Zr3N4 ZrO2 |
Zr |
Tetrakis(diethylamido)zirconium(IV) |
99.99 |
379.74 |
- |
128/
0.05 mm Hg |
J100023 |
|
Zr |
Tetrakis(dimethylamido)
zirconium(IV) |
99.99 |
267.53 |
57-60 |
- |
579211 |
|
Zr |
Tetrakis(ethylmethylamido)
zirconium(IV) |
99.99 |
323.63 |
- |
81/
0.1 mm Hg |
553131 |