Analytical Services
SAFC Hitech - Compound Semiconductor
 

To support production and R&D operations, our state-of-the-art tools provide analytical testing to the highest sensitivities for a wide range of contaminants. We offer an extensive array of techniques to fully characterize compounds and measure impurities to the lowest of levels.

For example, primary techniques employed for analysis of products to the semiconductor industry include FT-NMR, ICP-OES/MS, HR-ICP-MS and GC, but many more are employed to provide characterization or additional data on each product, including TGA, vapor pressure measurement and particle counting, depending upon customer requirements. SAFC Hitech has developed unique handling and sample preparation procedures that, coupled with cleanroom environments, ensure best performance from analytical tools utilized. Such capabilities are critical to ensuring background levels of contamination are minimized to achieve the low detection limits required.

Analytical instruments are operated by a team of skilled and highly trained analytical chemists. Instruments are validated using tools such as Gage R&R to monitor performance.  

Monitoring of advances in analytical technology and review of methodology are continuously employed the analytical capability can be improved to meet future expectations and challenges for product or specification development and improvement.

Our range of analytical services includes:

       

Identity Testing

 

Purity Testing

 

Identity Testing

Appearance

All compounds that pass through our quality department are automatically assigned this test code. This is often the first test that customers perform without realizing it. Although simple in nature, it can reveal many subtle flaws in the compound.

Spectroscopy

IR
· We employ both NIR and ATR. Both methods have different strengths and allow fundamental analysis of compounds to identify the compound or give clues to some of the impurities.

Multinuclear NMR (NMR)
· SAFC has a wide level of experience on several different isotopes- including but not limited to H, 13C, P, S, B, and F.

UV/Vis

Fluorescence

Mass Spectra
· Some sources include Chemical Ionization (CI), Electron Impact (EI), Electrospray Ionization (ESI), Atmospheric Pressure Chemical Ionization (APCI), and Matrix Assisted Desorption Ionization-Time of Flight (MALDI TOF)

RAMAN

Elemental Analysis

Carbon/Hydrogen/Nitrogen/Sulfur (CHNS)

 

Purity Testing

Chromatography

SAFC has a very wide range of analytical capibility in this area.

Gas Chromatography (GC)
· Thermal Conductivity Detector (TCD)
· Electron Capture Detector (ECD)
· Flame Ionization Detector (FID)
· Mass Spectra (MS)

Liquid Chromatography (LC)
· Ultra Violet Detector (UV)
· Mass Spectra (MS)
· Evaporative Light Scattering Detector (ELSD)
· Electrochemical Detector (ECD)
· Fluorescence Detector (FLD)
· Refractive Index (RI)

Ion Chromatography

Thin Layer Chromatography

Differential Scanning Calorimetry (DSC)

Thermogravimetric Analysis (TGA)

Spectroscopy

Flame Atomic Absorbtion (AA)

Graphite Furnace Atomic Absorption (GFAA)

Inductively Coupled Plasma Optical Emission Spectra (ICP-OES)

Inductively Coupled Plasma Mass Spectroscopy (ICP-MS)

Magnetic Sector Field Inductively Coupled Plasma Mass Spectroscopy (HR-ICP-MS)

Water Content Analysis

Karl Fischer Coulometric Titration

Karl Fischer Volumetric Titration

Elemental Analysis

Carbon/Hydrogen/Nitrogen/Sulfur (CHNS)

Density

Polarography

Vapor Pressure Measurement

Particle counting Measurement

 

 

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