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M4784 Sigma

Specimen mounts

For JEOL Instruments

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Properties

Related Categories Electron Microscopy, Electron Microscopy Mounts and Accessories, Labware, Microscopy & Staining
material   aluminum (with lathe finish)
diam. × H   9.5 mm × 9.5 mm

Description

General description

Surface has barely visible rings which help to locate the center.

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Documents

Certificate of Analysis

Protocols & Articles
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