AFM Probes

AFM, Atomic Force Microscope, probes or tips are designed to fit into most commercially available AFMs and outperform all other silicon SPM, Scanning Probe Microscope, probes used in surface analysis.

Useful for surface analysis in materials science, chemistry, physics and biology, and semiconductor applications.
  • Silicon and silicon nitride probes
  • Coatings: magnetic, gold, aluminum reflex, conductive chromium/platinum, gold/chromium
  • Modes: soft, tapping, force modulation, contact
AFM probe tip

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Z566705 BudgetSensors AFM probes silicon tip, gold coating, mode, contact
Z566632 BudgetSensors AFM probes silicon nitride tip, gold/chromium coating, mode, soft contact
Z566683 BudgetSensors AFM probes silicon tip, conductive Cr/Pt coating, mode, force modulation
Z566675 BudgetSensors AFM probes silicon tip, conductive Cr/Pt coating, mode, tapping
Z566691 BudgetSensors AFM probes silicon tip, conductive Cr/Pt coating, mode, contact
Z566667 BudgetSensors AFM probes silicon tip, magnetic coating, mode, force modulation
Z566659 BudgetSensors AFM probes silicon tip, aluminum reflex coating, mode, force modulation
Z566640 BudgetSensors AFM probes silicon tip, aluminum reflex coating, mode, contact
Z566624 BudgetSensors AFM probes silicon tip, aluminum reflex coating, mode, tapping