Merck
  • Home
  • Search Results
  • Quantifying the semiconducting fraction in single-walled carbon nanotube samples through comparative atomic force and photoluminescence microscopies.

Quantifying the semiconducting fraction in single-walled carbon nanotube samples through comparative atomic force and photoluminescence microscopies.

Nano letters (2009-07-31)
Anton V Naumov, Oleg A Kuznetsov, Avetik R Harutyunyan, Alexander A Green, Mark C Hersam, Daniel E Resasco, Pavel N Nikolaev, R Bruce Weisman
ABSTRACT

A new method was used to measure the fraction of semiconducting nanotubes in various as-grown or processed single-walled carbon nanotube (SWCNT) samples. SWCNT number densities were compared in images from near-IR photoluminescence (semiconducting species) and AFM (all species) to compute the semiconducting fraction. The results show large variations among growth methods and effective sorting by density gradient ultracentrifugation. This counting-based method provides important information about SWCNT sample compositions that can guide controlled growth methods and help calibrate bulk characterization techniques.

MATERIALS
Product Number
Brand
Product Description

Sigma-Aldrich
Carbon nanotube, single-walled, (6,5) chirality, ≥95% carbon basis (≥95% as carbon nanotubes), 0.78 nm average diameter