US EPA Method 525.2: GC Analysis of Semivolatiles on SLB^®-5ms

column

SLB-5ms, 30 m x 0.25 mm I.D., 0.25 μm (28471-U)

oven

45 °C (1 min), 50 °C/min to 130 °C (1 min), 12 °C/min to 180 °C, 7 °C/min to 240 °C, 12 °C/min to 330 °C (2 min)

inj. temp.

275 °C

MSD interface

330 °C

scan range

m/z = 45-450

carrier gas

helium, 0.9 mL/min., constant flow

injection

1 μL pulsed splitless (15 psi until 0.20 min) (1.0 min)

liner

4 mm I.D., single taper

sample

2 ppm, in ethyl acetate, of a 102 component semivolatile standard plus 3 surrogate and 3 internal standard compounds (at 5 ppm)