Orthorhombic polar Nd-doped BiFeO3 thin film on MgO substrate.

Journal of physics. Condensed matter : an Institute of Physics journal (2011-07-22)
I N Leontyev, Yu I Yuzyuk, P-E Janolin, M El-Marssi, D Chernyshov, V Dmitriev, Yu I Golovko, V M Mukhortov, B Dkhil
ABSTRACT

A Nd-doped BiFeO(3) thin film deposited on MgO substrate was studied by synchrotron diffraction. The ferroelectric nature of the film is proven by in-plane remanent polarization measurement. The highest possible symmetry of the film is determined to be orthorhombic, within the Fm2m space group. Such a structure is rotated by 45° with respect to the substrate and is consistent with tilts of oxygen octahedra doubling the unit cell. This polar structure presents a rather unusual strain-accommodation mechanism.

MATERIALS
Product Number
Brand
Product Description

Sigma-Aldrich
Bismuth(III) oxide, ReagentPlus®, powder, 10 μm, 99.9% trace metals basis
Sigma-Aldrich
Bismuth(III) oxide, powder, 99.999% trace metals basis
Sigma-Aldrich
Bismuth(III) oxide, nanopowder, 90-210 nm particle size, 99.8% trace metals basis
Sigma-Aldrich
Bismuth(III) oxide, purum, ≥98.0% (KT)