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High resolution quantitative piezoresponse force microscopy of BiFeO3 nanofibers with dramatically enhanced sensitivity.

Nanoscale (2011-11-22)
Shuhong Xie, Anil Gannepalli, Qian Nataly Chen, Yuanming Liu, Yichun Zhou, Roger Proksch, Jiangyu Li
ABSTRACT

Piezoresponse force microscopy (PFM) has emerged as the tool of choice for characterizing piezoelectricity and ferroelectricity of low-dimensional nanostructures, yet quantitative analysis of such low-dimensional ferroelectrics is extremely challenging. In this communication, we report a dual frequency resonance tracking technique to probe nanocrystalline BiFeO(3) nanofibers with substantially enhanced piezoresponse sensitivity, while simultaneously determining its piezoelectric coefficient quantitatively and correlating quality factor mappings with dissipative domain switching processes. This technique can be applied to probe the piezoelectricity and ferroelectricity of a wide range of low-dimensional nanostructures or materials with extremely small piezoelectric effects.

MATERIALS
Product Number
Brand
Product Description

Sigma-Aldrich
Bismuth(III) oxide, ReagentPlus®, powder, 10 μm, 99.9% trace metals basis
Sigma-Aldrich
Bismuth(III) oxide, powder, 99.999% trace metals basis
Sigma-Aldrich
Bismuth(III) oxide, nanopowder, 90-210 nm particle size, 99.8% trace metals basis
Sigma-Aldrich
Bismuth(III) oxide, purum, ≥98.0% (KT)