Product Number
Brand
Product Description
Sigma-Aldrich
Titanium, sputtering target, diam. × thickness 3.00 in. × 0.125 in., 99.995% trace metals basis
Supelco
L-Glutamic acid, certified reference material, TraceCERT®
Supelco
L-Glutamine, certified reference material, TraceCERT®
Supelco
L-Asparagine, certified reference material, TraceCERT®
Supelco
L-Isoleucine, certified reference material, TraceCERT®
Supelco
L-Phenylalanine, analytical standard, for Nitrogen Determination According to Kjeldahl Method
Supelco
L-Phenylalanine, certified reference material, TraceCERT®
Supelco
L-Serine, certified reference material, TraceCERT®
Supelco
L-Serine, Pharmaceutical Secondary Standard; Certified Reference Material
Supelco
L-Glutamic acid, Pharmaceutical Secondary Standard; Certified Reference Material
Sigma-Aldrich
Calcium, dendritic pieces, purified by distillation, 99.9% trace metals basis
Sigma-Aldrich
Silicon, wafer, <111>, P-type, contains boron as dopant, diam. × thickness 2 in. × 0.3 mm
Sigma-Aldrich
Silicon, wafer (single side polished), <100>, N-type, contains no dopant, diam. × thickness 3 in. × 0.5 mm
Fumaric acid, European Pharmacopoeia (EP) Reference Standard
Sigma-Aldrich
Copper, nanopowder, 40-60 nm particle size (SAXS), ≥99.5% trace metals basis
Sigma-Aldrich
Copper, nanopowder, 60-80 nm particle size (SAXS), ≥99.5% trace metals basis
L-Arabinitol, European Pharmacopoeia (EP) Reference Standard
Sigma-Aldrich
Silicon, sputtering target, diam. × thickness 2.00 in. × 0.25 in., 99.999% trace metals basis
Sigma-Aldrich
Nickel, sputtering target, diam. × thickness 2.00 in. × 0.25 in., 99.95% trace metals basis
Supelco
L-Glutamine, Pharmaceutical Secondary Standard; Certified Reference Material
Supelco
L-Phenylalanine, Pharmaceutical Secondary Standard; Certified Reference Material
Supelco
L-Isoleucine, Pharmaceutical Secondary Standard; Certified Reference Material
Sigma-Aldrich
Silicon, wafer (single side polished), <100>, N-type, contains phosphorus as dopant, diam. × thickness 2 in. × 0.5 mm
Sigma-Aldrich
Silicon, wafer (single side polished), contains phosphorus as dopant, <111>, N-type, diam. × thickness 2 in. × 0.5 mm
Sigma-Aldrich
Silicon, wafer (single side polished), <100>, P-type, contains boron as dopant, diam. × thickness 2 in. × 0.5 mm
Sigma-Aldrich
Silicon, wafer (single side polished), <111>, P-type, contains boron as dopant, diam. × thickness 3 in. × 0.5 mm
Sigma-Aldrich
Silicon, wafer (single side polished), <100>, N-type, contains phosphorus as dopant, diam. × thickness 3 in. × 0.5 mm
Sigma-Aldrich
Silicon, wafer (single side polished), <111>, N-type, contains no dopant, diam. × thickness 2 in. × 0.5 mm
Sigma-Aldrich
Silicon, wafer (single side polished), <100>, N-type, contains no dopant, diam. × thickness 2 in. × 0.5 mm