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Ultramicroscopy

Radiation damage due to knock-on processes on carbon foils cooled to liquid helium temperature.


PMID 695132

Abstract

Radiation damage on a holey carbon foil was investigated in an electron microscope with a superconducting lens system, where the temperature of the specimen and its environment initially was 4 K. Due to an electron dose of 2 X 10(4) As/cm2 the diameter of a hole increased 5 nm. Rough calculations show that this increase can be ascribed to knock-on processes. Estimates of the rise in specimen temperature during the irradiation are given.