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357340 Sigma-Aldrich

Rhodium

foil, thickness 0.025 mm, 99.9% trace metals basis

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Properties

Related Categories High-Purity Metal Foils, Materials Science, Metal and Ceramic Science, Metals, Micro/NanoElectronics,
assay   99.9% trace metals basis
form   foil
resistivity   4.33 μΩ-cm, 20°C
thickness   0.025 mm
bp   3727 °C (lit.)
mp   1966 °C (lit.)
density   12.41 g/cm3 (lit.)
SMILES string   [Rh]
InChI   1S/Rh
InChI key   MHOVAHRLVXNVSD-UHFFFAOYSA-N

Description

Packaging

190 mg in rigid mailer

Quantity

190 mg = 25 × 25 mm

Safety & Documentation

Safety Information

Hazard statements 
RIDADR 
NONH for all modes of transport
WGK Germany 
nwg
RTECS 
VI9069000
Flash Point(F) 
Not applicable
Flash Point(C) 
Not applicable
Protocols & Articles

Articles

Combinatorial Materials Science for Energy Applications

Materials are the fundamental basis for solutions to the most pressing issues in energy generation, transport, and utilization, as well as more general issues in sustainability. In many cases, long-t...
R. Bruce van Dover
Keywords: Asymmetric synthesis, Catalysis, Chemical vapor deposition, Combinatorial synthesis, Dehydrogenation, Deposition, Diffraction, Diffusion, Evaporation, Genetic, Hydration reaction, Materials Science, Microscopy, Nucleic acid annealing, Oxidations, Photovoltaics, Polymerization reactions, Reductions, Semiconductor, Substitutions, Thin film deposition, X-Ray diffraction

Responsive Rare-Earth Materials and their Applications

Yaroslav Mudryk Ames Laboratory of U.S. Department of Energy, Iowa State University Ames, Iowa 50011 USA Email: slavkomk@ameslab.gov
Yaroslav Mudryk
Material Matters, 2016, 11.4
Keywords: Diffraction, PAGE, transformation

Peer-Reviewed Papers
15

References

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