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635050 Aldrich

LSAT

single crystal substrate, <100>, ≥99.9% trace metals basis

Synonym: Lanthanum aluminum oxide-strontium aluminum tantalum oxide

  • Linear Formula (LaAlO3)3(Sr2AlTaO6)7

  • Molecular Weight 3995.82

  •  MDL number MFCD06200704

  •  PubChem Substance ID 329759867

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Properties

Related Categories Electronic Materials, Materials Science, Micro/NanoElectronics, Organic and Printed Electronics, Single Crystal Substrates,
description   single side polished
InChI Key   YSEGFJHLRWDERW-UHFFFAOYSA-N
assay   ≥99.9% trace metals basis
dielectric constant   ~22
size   10 mm × 10 mm × 0.5 mm
mp   1840 °C(lit.)
density   6.74 g/mL at 25 °C(lit.)
semiconductor properties   <100>

Description

Packaging

1 ea in rigid mailer

Physical form

cubic (a = 3.868 Å)

Physical properties

Thermal expansion = 10 × 10 -6/°C

Safety & Documentation

Safety Information

RIDADR 
NONH for all modes of transport
WGK Germany 
3

Documents

Certificate of Analysis

Protocols & Articles

Articles

Building and Engineering Micro/Nano Architectures of Single-Walled Carbon Nanotubes for Electronic Applications

1Department of Mechanical and Industrial Engineering, Northeastern University, Boston, MA 02115, USA 2Department of Physics, Northeastern University, Boston, MA 02115, USA 3Department of Mechanical E...
Ji Hao,1 Hyunyoung Jung,1 Younglae Kim,1 Bo Li,1,3 Swastik Kar,2 Yung Joon Jung1*
Material Matters, 2017, 12.1
Keywords: Chromatin immunoprecipitation, Environmental, Nanotubes, Redox Reactions, Reductions, transformation

Deposition Substrates and Silicon Wafers

Successful deposition of materials often depends on the proper substrates, with a good lattice match and a clean, even surface. Aldrich is proud to offer a variety of new single crystal substrates an...
Chemfiles Volume 4 Article 3
Keywords: Deposition, Diffraction, Semiconductor, Trace metal analysis, X-Ray diffraction

Recent Progress in Spintronic Materials

Soubantika Palchoudhury,1 Karthik Ramasamy,2* Arunava Gupta3* 1Civil and Chemical Engineering, University of Tennessee at Chattanooga, Chattanooga, Tennessee 37403, USA 2Center for Integrated Nanotec...
Soubantika Palchoudhury, Karthik Ramasamy, Arunava Gupta
By: Dr. Hui Zhu, Material Matters, 2016, 11.4
Keywords: Catalysis, Microscopy, Scanning electron microscopy, Semiconductor, Transmission electron microscopy

Peer-Reviewed Papers
15

References

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