AFM Probes

AFM, Atomic Force Microscope, probes or tips are designed to fit into most commercially available AFMs and outperform all other silicon SPM, Scanning Probe Microscope, probes used in surface analysis.

Useful for surface analysis in materials science, chemistry, physics and biology, and semiconductor applications.
  • Silicon and silicon nitride probes
  • Coatings: magnetic, gold, aluminum reflex, conductive chromium/platinum, gold/chromium
  • Modes: soft, tapping, force modulation, contact
AFM probe tip

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Z566683 BudgetSensors AFM probes silicon tip, conductive Cr/Pt coating, mode, force modulation
Z566667 BudgetSensors AFM probes silicon tip, magnetic coating, mode, force modulation
Z566640 BudgetSensors AFM probes silicon tip, aluminum reflex coating, mode, contact
Z566624 BudgetSensors AFM probes silicon tip, aluminum reflex coating, mode, tapping