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Dialysis-Chelex method for determination of exchangeable copper in human plasma.

Analytical and bioanalytical chemistry (2004-03-03)
Tony I Venelinov, Ian M Davies, John H Beattie
ZUSAMMENFASSUNG

A method based on dialysis in the presence of histidine, and subsequent copper adsorption and preconcentration using Chelex-100 resin, has been developed for selective extraction of exchangeable copper from blood plasma. The method was verified by comparative analysis using two different instrumental techniques, ICP-MS and AAS. The results obtained were in excellent agreement. Accurate quantification of the exchangeable copper and the firmly bound copper was achieved. The method was further validated by analysis of a lyophilised human serum certified reference material.

MATERIALIEN
Produktnummer
Marke
Produktbeschreibung

Sigma-Aldrich
Kupfer, powder, <425 μm, 99.5% trace metals basis
Sigma-Aldrich
Kupfer, foil, thickness 0.25 mm, 99.98% trace metals basis
Sigma-Aldrich
Kupfer, powder, 99.99% trace metals basis
Sigma-Aldrich
Kupfer, powder, <75 μm, 99%
Sigma-Aldrich
Kupfer, wire, diam. 1.0 mm, ≥99.9%
Sigma-Aldrich
Kupfer, nanopowder, 40-60 nm particle size (SAXS), ≥99.5% trace metals basis
Sigma-Aldrich
Kupfer, powder (spheroidal), 10-25 μm, 98%
Sigma-Aldrich
Kupfer, powder (dendritic), <45 μm, 99.7% trace metals basis
Sigma-Aldrich
Kupfer, foil, thickness 0.025 mm, 99.98% trace metals basis
Sigma-Aldrich
Kupfer, turnings, purum p.a., ≥99.0%
Sigma-Aldrich
Kupfer, nanopowder, 60-80 nm particle size (APS), ≥99.5% trace metals basis
Sigma-Aldrich
Kupfer, ACS reagent, granular, 10-40 mesh, ≥99.90%
Sigma-Aldrich
Kupfer, beads, 2-8 mm, 99.9995% trace metals basis
Sigma-Aldrich
Kupfer, foil, ≥99.8% (complexometric)
Sigma-Aldrich
Kupfer, foil, thickness 1.0 mm, 99.999% trace metals basis
Sigma-Aldrich
Kupfer, foil, thickness 0.5 mm, 99.98% trace metals basis
Sigma-Aldrich
Kupfer, wire, diam. 0.25 mm, 99.999% trace metals basis
Sigma-Aldrich
Kupfer, shot, −3-+14 mesh, 99%
Sigma-Aldrich
Kupfer, beads, 2-8 mm, ≥99.99% trace metals basis
Sigma-Aldrich
Kupfer, wire, diam. 2.0 mm, 99.999% trace metals basis
Sigma-Aldrich
Kupfer, wire, diam. 0.64 mm, 99.995% trace metals basis
Stranggusskupfer (O), BCR®, certified reference material, rod
Kupfer, IRMM®, certified reference material, 0.5 mm wire
Kupfer, IRMM®, certified reference material, 0.1 mm foil
Kupfer (O), BCR®, certified reference material, rod
Kupfer (S, P), BCR®, certified reference material, chips