Numer produktu
Marka
Opis produktu
Sigma-Aldrich
Aluminum, pellets, 3-12 mm, 99.99% trace metals basis
Supelco
Taurine, Pharmaceutical Secondary Standard; Certified Reference Material
Sigma-Aldrich
Taurine, ≥98%, FG
Sigma-Aldrich
Titanium, evaporation slug, diam. × L 6.3 mm × 6.3 mm, ≥99.99% trace metals basis
Sigma-Aldrich
Calcium, dendritic pieces, purified by distillation, 99.9% trace metals basis
Sigma-Aldrich
Aluminum, foil, thickness 1.0 mm, 99.999% trace metals basis
Sigma-Aldrich
Silicon, wafer (single side polished), <111>, P-type, contains boron as dopant, diam. × thickness 3 in. × 0.5 mm
Sigma-Aldrich
Silicon, wafer (single side polished), <111>, N-type, contains no dopant, diam. × thickness 3 in. × 0.5 mm
Sigma-Aldrich
Silicon, wafer (single side polished), contains phosphorus as dopant, <111>, N-type, diam. × thickness 2 in. × 0.5 mm
Sigma-Aldrich
Silicon, wafer (single side polished), <100>, N-type, contains phosphorus as dopant, diam. × thickness 3 in. × 0.5 mm
Sigma-Aldrich
Silicon, wafer (single side polished), <100>, P-type, contains boron as dopant, diam. × thickness 3 in. × 0.5 mm
Sigma-Aldrich
Silicon, wafer (single side polished), <100>, N-type, contains phosphorus as dopant, diam. × thickness 2 in. × 0.5 mm
Sigma-Aldrich
Silicon, wafer (single side polished), <100>, N-type, contains no dopant, diam. × thickness 3 in. × 0.5 mm
Sigma-Aldrich
Titanium, sputtering target, diam. × thickness 2.00 in. × 0.25 in., 99.995% trace metals basis
Sigma-Aldrich
DL-Homocysteine, ≥95% (titration)
Sigma-Aldrich
Taurine, suitable for cell culture, meets USP testing specifications
Sigma-Aldrich
Tin, wire, diam. 0.5 mm, 99.999% trace metals basis
Sigma-Aldrich
Raney®-Nickel, W.R. Grace and Co. Raney® 4200, slurry, in H2O, active catalyst
Sigma-Aldrich
Bismuth, beads, 1-5 mm, 99.999% trace metals basis
Sigma-Aldrich
Tungsten, wire, diam. 0.5 mm, ≥99.9% trace metals basis
Sigma-Aldrich
Raney®-Nickel, W.R. Grace and Co. Raney® 3202, slurry, in H2O, active catalyst
Sigma-Aldrich
Titanium, foil, thickness 0.127 mm, ≥99.99% trace metals basis
Copper (O), BCR®, certified reference material, rod
Sigma-Aldrich
Bismuth, granular, ≥99.99% trace metals basis
Copper, IRMM®, certified reference material, 0.1 mm foil
Copper (S, P), BCR®, certified reference material, chips
Titanium, IRMM®, certified reference material, 0.1 mm foil
Copper, IRMM®, certified reference material, 0.5 mm wire
Aluminum, IRMM®, certified reference material, 0.1 mm foil